CCD image sensors in deep-ultraviolet : degradation behavior and damage mechanisms /

Bibliographic Details
Main Author: Li, F. M. (Flora M.)
Corporate Author: SpringerLink (Online service)
Other Authors: Nathan, Arokia, 1957-
Format: eBook
Language:English
Published: Berlin ; New York : Springer, 2005.
Series:Microtechnology and MEMS.
Subjects:
Online Access:Connect to the full text of this electronic book
Publisher description
Description
Item Description:Electronic resource.
Physical Description:xi, 231 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:354027412X
9783540274124
ISSN:1439-6599
DOI:10.1007/b139047