CCD image sensors in deep-ultraviolet : degradation behavior and damage mechanisms /

Bibliographic Details
Main Author:	Li, F. M. (Flora M.)
Corporate Author:	SpringerLink (Online service)
Other Authors:	Nathan, Arokia, 1957-
Format:	eBook
Language:	English
Published:	Berlin ; New York : Springer, 2005.
Series:	Microtechnology and MEMS.
Subjects:	Charge coupled devices. Image processing > Digital techniques. Remote sensing. Service life (Engineering) Electronic books.
Online Access:	Connect to the full text of this electronic book Publisher description

Available Online