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Stress-induced phenomena in metallization : Tenth International Workshop on Stress-Induced Phenomena in Metallization : Austin, Texas, 5-7 November 2008 /

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Bibliographic Details
Corporate Author: International Workshop on Stress-Induced Phenomena in Metallization Austin, Texas
Other Authors: Ho, P. S., Ogawa, Shinichi, Zschech, Ehrenfried
Format: Conference Proceeding Book
Language:English
Published: Melville, N.Y. : American Institute of Physics, , 2009.
Series:AIP conference proceedings ; no. 1143.
Subjects:
Interconnects (Integrated circuit technology) > Defects > Congresses.
Metal-metal bonds > Congresses.
Strength of materials > Congresses.
Nanostructured materials > Congresses.
Semiconductors > Congresses.
Copper > Electric properties > Congresses.

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Call Number: TK7871.85 .I58 2008
 
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TK7871.85 .I58 2008 Available