System-on-chip test architectures : nanometer design for testability /
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semic...
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| Other Authors: | , , |
| Format: | eBook |
| Language: | English |
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Amsterdam ; Boston :
Morgan Kaufmann Publishers,
[2008]
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| Series: | Morgan Kaufmann series in systems on silicon.
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| Subjects: | |
| Online Access: | Connect to the full text of this electronic book Table of contents only Publisher description |
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