System-on-chip test architectures : nanometer design for testability /

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semic...

Full description

Bibliographic Details
Corporate Author: ScienceDirect (Online service)
Other Authors: Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A.
Format: eBook
Language:English
Published: Amsterdam ; Boston : Morgan Kaufmann Publishers, [2008]
Series:Morgan Kaufmann series in systems on silicon.
Subjects:
Online Access:Connect to the full text of this electronic book
Table of contents only
Publisher description

Internet

Connect to the full text of this electronic book
Table of contents only
Publisher description

Available Online

Holdings details from Available Online
Call Number: TK7895.E42 S978 2008eb
 
Call Number Status Get It
TK7895.E42 S978 2008eb Available