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System-on-chip test architectures : nanometer design for testability /

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Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semic...

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Bibliographic Details
Corporate Author: ScienceDirect (Online service)
Other Authors: Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A.
Format: eBook
Language:English
Published: Amsterdam ; Boston : Morgan Kaufmann Publishers, [2008]
Series:Morgan Kaufmann series in systems on silicon.
Subjects:
Systems on a chip > Testing.
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Electronic books.
Online Access:Connect to the full text of this electronic book
Table of contents only
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