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Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /

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Bibliographic Details
Corporate Author: Institution of Engineering and Technology
Other Authors: Sun, Yichuang
Format: Book
Language:English
Published: London : Institution of Engineering and Technology, 2008.
Series:IET circuits, devices and systems series ; 19.
Subjects:
Linear integrated circuits > Testing.
Mixed signal circuits > Testing.
Radio frequency integrated circuits > Testing.
Description
Physical Description:xx, 389 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:9780863417450 (pbk.)
0863417450 (pbk.)