Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /

Bibliographic Details
Corporate Author:	Institution of Engineering and Technology
Other Authors:	Sun, Yichuang
Format:	Book
Language:	English
Published:	London : Institution of Engineering and Technology, 2008.
Series:	IET circuits, devices and systems series ; 19.
Subjects:	Linear integrated circuits > Testing. Mixed signal circuits > Testing. Radio frequency integrated circuits > Testing.

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