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An introduction to logic circuit testing /

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Bibliographic Details
Main Author: Lala, Parag K., 1948-
Format: Book
Language:English
Published: [San Rafael, Calif.] : Morgan & Claypool Publishers, [2009]
Series:Synthesis lectures on digital circuits and systems ; #17.
Subjects:
Logic circuits > Testing.
Digital electronics > Testing.
Integrated circuits > Very large scale integration > Testing.
Electric fault location.
Table of Contents:
  • Introduction
  • Fault detection in logic circuits
  • Design for testability
  • Built-in self-test.