An introduction to logic circuit testing /

Bibliographic Details
Main Author:	Lala, Parag K., 1948-
Format:	Book
Language:	English
Published:	[San Rafael, Calif.] : Morgan & Claypool Publishers, [2009]
Series:	Synthesis lectures on digital circuits and systems ; #17.
Subjects:	Logic circuits > Testing. Digital electronics > Testing. Integrated circuits > Very large scale integration > Testing. Electric fault location.

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