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Semiconductor material and device characterization /

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Bibliographic Details
Main Author: Schroder, Dieter K.
Corporate Author: Wiley InterScience (Online service)
Format: eBook
Language:English
Published: [Piscataway, N.J.] : Hoboken, N.J. : IEEE Press ; Wiley, [2006]
Edition:3rd ed.
Subjects:
Semiconductors > Testing.
Semiconductors.
Electronic books.
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • Resistivity
  • Carrier and doping density
  • Contact resistance and Schottky barriers
  • Series resistance, channel length and width, and threshold voltage
  • Defects
  • Oxide and interface trapped charges, oxide thickness
  • Carrier lifetimes
  • Mobility
  • Charge-based and probe characterization
  • Optical characterization
  • Chemical and physical characterization
  • Reliability and failure analysis.