Semiconductor material and device characterization /

Bibliographic Details
Main Author:	Schroder, Dieter K.
Corporate Author:	Wiley InterScience (Online service)
Format:	eBook
Language:	English
Published:	[Piscataway, N.J.] : Hoboken, N.J. : IEEE Press ; Wiley, [2006]
Edition:	3rd ed.
Subjects:	Semiconductors > Testing. Semiconductors. Electronic books.
Online Access:	Connect to the full text of this electronic book

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