Semiconductor material and device characterization /
| Main Author: | |
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| Corporate Author: | |
| Format: | eBook |
| Language: | English |
| Published: |
[Piscataway, N.J.] : Hoboken, N.J. :
IEEE Press ; Wiley,
[2006]
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| Edition: | 3rd ed. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Item Description: | "Wiley-Interscience." Electronic resource. |
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| Physical Description: | xv, 779 pages : illustrations ; 25 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0471749095 9780471749097 |
| DOI: | 10.1002/0471749095 |