APA (7th ed.) Citation

Schroder, D. K. (2006). Semiconductor material and device characterization (3rd ed.). IEEE Press ; Wiley. https://doi.org/10.1002/0471749095

Chicago Style (17th ed.) Citation

Schroder, Dieter K. Semiconductor Material and Device Characterization. 3rd ed. [Piscataway, N.J.] : Hoboken, N.J.: IEEE Press ; Wiley, 2006. https://doi.org/10.1002/0471749095.

MLA (9th ed.) Citation

Schroder, Dieter K. Semiconductor Material and Device Characterization. 3rd ed. IEEE Press ; Wiley, 2006. https://doi.org/10.1002/0471749095.