Cover Image

Thin film analysis by X-ray scattering /

Bibliographic Details
Main Author: Birkholz, Mario
Corporate Author: John Wiley & Sons
Other Authors: Fewster, Paul F., Genzel, Christoph
Format: eBook
Language:English
Published: Weinheim : Wiley-VCH, [2006]
Subjects:
Thin films.
X-ray spectroscopy.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:xxii, 356 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:3527310525 (print ed.)
3527607595 (electronic bk.)
9783527310524 (print ed.)
9783527607594 (electronic bk.)
DOI:10.1002/3527607595