Thin film analysis by X-ray scattering /

Bibliographic Details

Main Author:	Birkholz, Mario
Corporate Author:	John Wiley & Sons
Other Authors:	Fewster, Paul F., Genzel, Christoph
Format:	eBook
Language:	English
Published:	Weinheim : Wiley-VCH, [2006]
Subjects:	Thin films. X-ray spectroscopy. Electronic books.
Online Access:	Connect to the full text of this electronic book