APA (7th ed.) Citation

Birkholz, M., Fewster, P. F., & Genzel, C. (2006). Thin film analysis by X-ray scattering. Wiley-VCH. https://doi.org/10.1002/3527607595

Chicago Style (17th ed.) Citation

Birkholz, Mario, Paul F. Fewster, and Christoph Genzel. Thin Film Analysis by X-ray Scattering. Weinheim: Wiley-VCH, 2006. https://doi.org/10.1002/3527607595.

MLA (9th ed.) Citation

Birkholz, Mario, et al. Thin Film Analysis by X-ray Scattering. Wiley-VCH, 2006. https://doi.org/10.1002/3527607595.