APA (7th ed.) Citation

Society of Photo-optical Instrumentation Engineers, Boston University. Photonics Center, Hartzell, A. L., & Ramesham, R. (2008). Reliability, packaging, testing, and characterization of MEMS/MOEMS VII: 21-22 January 2008, San Jose, California, USA. SPIE.

Chicago Style (17th ed.) Citation

Society of Photo-optical Instrumentation Engineers, Boston University. Photonics Center, Allyson L. Hartzell, and Rajeshuni Ramesham. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII: 21-22 January 2008, San Jose, California, USA. Bellingham, Washington: SPIE, 2008.

MLA (9th ed.) Citation

Society of Photo-optical Instrumentation Engineers, et al. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII: 21-22 January 2008, San Jose, California, USA. SPIE, 2008.