Reliability, packaging, testing, and characterization of MEMS/MOEMS VII : 21-22 January 2008, San Jose, California, USA /
| Corporate Authors: | , |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
[2008]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 6884. |
| Subjects: | |
| Online Access: | https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/6884.toc |
Internet
https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/6884.tocRemote Storage
| Call Number: |
TK7875 .R45 2008 |
|
|---|---|---|
| Call Number | Status | Get It |
| TK7875 .R45 2008 | Available | |