Precision landmark location for machine vision and photogrammetry : finding and achieving the maximum possible accuracy /

Bibliographic Details
Main Author: Gutiérrez Álvarez, José A.
Corporate Author: SpringerLink (Online service)
Other Authors: Armstrong, Brian Stewart Randall
Format: eBook
Language:English
Published: London : Springer, [2008]
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:xi, 162 pages : illustrations (some) ; 24 cm.
Bibliography:Includes bibliographical references (pages [155]-157) and index.
ISBN:1846289130
9781846289132
DOI:10.1007/978-1-84628-913-2