Precision landmark location for machine vision and photogrammetry : finding and achieving the maximum possible accuracy /

Bibliographic Details
Main Author: Gutiérrez Álvarez, José A.
Corporate Author: SpringerLink (Online service)
Other Authors: Armstrong, Brian Stewart Randall
Format: eBook
Language:English
Published: London : Springer, [2008]
Subjects:
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Call Number: TA1634 .G88 2008eb
 
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TA1634 .G88 2008eb Available