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Defect-oriented testing for nano-metric CMOS VLSI circuits /

Bibliographic Details
Main Author: Sachdev, Manoj
Corporate Author: SpringerLink (Online service)
Other Authors: Pineda de Gyvez, José
Format: eBook
Language:English
Published: Dordrecht : Springer, [2007]
Edition:2nd ed.
Series:Frontiers in electronic testing ; 34.
Subjects:
Integrated circuits > Very large scale integration > Defects.
Integrated circuits > Very large scale integration > Testing.
Metal oxide semiconductors, Complementary > Defects.
Metal oxide semiconductors, Complementary > Testing.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
New edition of: Defect oriented testing for CMOS analog and digital circuits, 1998.
Physical Description:xxi, 328 pages : illustrations ; 24 cm.
ISBN:0387465472
9780387465470
DOI:10.1007/0-387-46547-2