Defect-oriented testing for nano-metric CMOS VLSI circuits /

Bibliographic Details
Main Author:	Sachdev, Manoj
Corporate Author:	SpringerLink (Online service)
Other Authors:	Pineda de Gyvez, José
Format:	eBook
Language:	English
Published:	Dordrecht : Springer, [2007]
Edition:	2nd ed.
Series:	Frontiers in electronic testing ; 34.
Subjects:	Integrated circuits > Very large scale integration > Defects. Integrated circuits > Very large scale integration > Testing. Metal oxide semiconductors, Complementary > Defects. Metal oxide semiconductors, Complementary > Testing. Electronic books.
Online Access:	Connect to the full text of this electronic book

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