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System-on-chip test architectures : nanometer design for testability /

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Bibliographic Details
Other Authors: Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A.
Format: Book
Language:English
Published: Amsterdam ; Boston : Morgan Kaufmann Publishers, [2008]
Series:Morgan Kaufmann series in systems on silicon.
Subjects:
Systems on a chip > Testing.
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Online Access:Table of contents only
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