System-on-chip test architectures : nanometer design for testability /

Bibliographic Details
Other Authors:	Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A.
Format:	Book
Language:	English
Published:	Amsterdam ; Boston : Morgan Kaufmann Publishers, [2008]
Series:	Morgan Kaufmann series in systems on silicon.
Subjects:	Systems on a chip > Testing. Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design.
Online Access:	Table of contents only

Table of contents only

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