Cover Image

System-on-chip test architectures : nanometer design for testability /

Show other versions (2)
Bibliographic Details
Other Authors: Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A.
Format: Book
Language:English
Published: Amsterdam ; Boston : Morgan Kaufmann Publishers, [2008]
Series:Morgan Kaufmann series in systems on silicon.
Subjects:
Systems on a chip > Testing.
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Online Access:Table of contents only
Description
Physical Description:xxxvi, 856 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:9780123739735 (hardcover : alk. paper)
012373973X (hardcover : alk. paper)