Cover Image

Time and frequency metrology : 29-30 August 2007, San Diego, California, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Jones, R. Jason
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2007]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 6673.
Subjects:
Time measurements > Congresses.
Measurement > Congresses.
Metrology.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/6673.toc
Description
Physical Description:1 volume (various pagings) : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:9780819468215
0819468215