Time and frequency metrology : 29-30 August 2007, San Diego, California, USA /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Jones, R. Jason
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2007]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 6673.
Subjects:	Time measurements > Congresses. Measurement > Congresses. Metrology.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/6673.toc

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