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Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Duparré, Angela, Singh, Bhanwar, Gu, Zu-Han
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2007]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 6672.
Subjects:
Optical materials > Congresses.
Semiconductors > Characterization > Congresses.
Optoelectronics > Congresses.
Information storage and retrieval systems > Congresses.
Metrology > Congresses.
Optoelectronic devices > Congresses.
Optical measurements > Congresses.
Thin films > Optical properties > Congresses.
Nanotechnology > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/6672.toc

Internet

https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/6672.toc

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: QC373 .A38 2007
 
Call Number Status Get It
QC373 .A38 2007 Available