Frontiers of characterization and metrology for nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Gaithersburg, Maryland, 27-29 March 2007 /

Bibliographic Details
Corporate Authors:	International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, National Institute of Standards and Technology (U.S.)
Other Authors:	Seller, David G.
Format:	Conference Proceeding Software eBook
Language:	English
Published:	Melville, N. Y. : American Institute of Physics, 2007.
Series:	AIP conference proceedings. v. 931.
Subjects:	Integrated circuits > Ultra large scale integration > Congresses. Nanoelectronics > Congresses.

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