Damage to VUV, EUV, and X-ray optics : 18-19 April 2007, Prague, Czech Republic /

Bibliographic Details
Corporate Authors: SPIE Europe, Society of Photo-optical Instrumentation Engineers
Other Authors: Juha, Libor, Sobierajski, Ryszard H., Wabnitz, Hubertus
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2007]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 6586.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/6586.toc

Internet

https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/6586.toc

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: QC459.5 .D36 2007
 
Call Number Status Get It
QC459.5 .D36 2007 Available