Cover Image

The effect of load sequence on fatigue crack propagation under random loading and program loading /

Bibliographic Details
Main Author: Schijve, Jaap
Corporate Author: Nationaal Lucht- en Ruimtevaartlaboratorium (Netherlands)
Other Authors: Jacobs, F. A., Tromp, P. J.
Format: Book
Language:English
Published: The Netherlands : Nationaal Lucht- en Ruimtevaartlaboratorium, [1971?]
Subjects:
Materials > Fatigue.
Description
Item Description:"NLR TR 71014 U."
"N71-30303."
Physical Description:24 unnumbered pages : illustrations
Bibliography:Includes bibliographical references.