The effect of load sequence on fatigue crack propagation under random loading and program loading /

Bibliographic Details
Main Author: Schijve, Jaap
Corporate Author: Nationaal Lucht- en Ruimtevaartlaboratorium (Netherlands)
Other Authors: Jacobs, F. A., Tromp, P. J.
Format: Book
Language:English
Published: The Netherlands : Nationaal Lucht- en Ruimtevaartlaboratorium, [1971?]
Subjects:

Remote Storage

Holdings details from Remote Storage
Call Number: TA418.38 .S35 1971
 
Call Number Status Get It
TA418.38 .S35 1971 Available