Reliability-yield allocation for semiconductor integrated circuits : modeling and optimization /

Integrated circuit quality and reliability /
by: Hnatek, Eugene R.
Published: (1995)

Integrated circuit quality and reliability /
by: Hnatek, Eugene R.
Published: (1995)

Reliability physics 1980 : 18th annual proceedings, Las Vegas, Nevada, April 8-10, 1980 /
Published: (1980)

Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development /
by: Kuo, Way, 1951-
Published: (1998)

Electromigration on semiconductor integrated circuits.
Published: (2002)

Guidebook for managing silicon chip reliability /
by: Pecht, Michael
Published: (1999)

Integrated circuits and semiconductor devices : theory and application /
by: Deboo, Gordon J.
Published: (1977)

Testing and reliable design of CMOS circuits /
by: Jha, Niraj K.
Published: (1990)

Handbook of semiconductor lasers and photonic integrated circuits /
Published: (1994)

Microelectronics manufacturing, yield, and reliability : 20-21 October 1994, Austin, Texas /
Published: (1994)

Models for large integrated circuits /
by: Dewilde, P.
Published: (1990)

Semiconductor integrated circuit processing technology /
by: Runyan, W. R.
Published: (1990)

Semiconductor devices and integrated electronics /
by: Milnes, A. G. (Arthur George), 1922-
Published: (1980)

Modeling, optimization and testing for analog/mixed-signal circuits in deeply scaled CMOS technologies /
by: Yu, Guo
Published: (2011)

Transistors and integrated circuits /
by: Latham, Donald C.
Published: (1966)

Power integrity modeling and design for semiconductors and systems /
by: Swaminathan, Madhavan
Published: (2008)

Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development /
by: Kuo, Way, 1951-
Published: (1998)

Materials, technology and reliability for advanced interconnects--2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A /
Published: (2005)

Device electronics for integrated circuits /
by: Muller, Richard S.
Published: (1977)

Device electronics for integrated circuits /
by: Muller, Richard S.
Published: (2003)

Integrated circuit quality and reliability /
by: Hnatek, Eugene R.
Published: (1995)

IEEE International Integrated Reliability Workshop final report /

Failure-free integrated circuit packages : systematic elimination of failures through reliability engineering, failure analysis, and material improvements /
Published: (2004)

Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A /
Published: (2001)

Materials, technology and reliability of low-k dielectrics and copper interconnects : symposium held April 18-21, 2006, San Francisco, California, U.S.A. /
Published: (2006)

International Integrated Reliability Workshop final report.

Materials, technology and reliability for advanced interconnects and low-k dielectrics, 2003 : symposium held April 21-25, 2003, San Francisco, California, U.S.A /
Published: (2003)

Materials, technology and reliability for advanced interconnects and low-k dielectrics--2004 : symposium held April 13-15, 2004, San Francisco, California, U.S.A /
Published: (2004)

Conference on the Physics and Technology of Semiconductor Devices and Integrated Circuits : proceedings, 5-7 February 1992, Indian Institute of Technology, Madras, India /
Published: (1992)

Solid-state devices and integrated circuits /
by: Cooper, William David
Published: (1982)

III-V integrated circuit fabrication technology /
by: Tiku, Shiban Kishan, et al.
Published: (2016)

Silicon integrated circuits /
Published: (1981)

Yield simulation for integrated circuits /
by: Walker, Duncan Moore Henry
Published: (1987)

Devices for integrated circuits : silicon and III-V compound semiconductors /
by: Casey, H. Craig
Published: (1999)

Integrating reliability into microelectronics manufacturing /
by: Christou, A.
Published: (1994)

ESD : failure mechanisms and models /
by: Voldman, Steven H.
Published: (2009)