Reliability-yield allocation for semiconductor integrated circuits : modeling and optimization /

Bibliographic Details

Main Author:	Ha, Chunghun, 1969-
Other Authors:	Kuo, Way (Thesis advisor)
Format:	Thesis eBook
Language:	English
Published:	[College Station, Tex.] : [Texas A&M University], [2005]
Subjects:	Major Industrial Engineering. reliability semiconductor integrated circuits modeling allocation optimization yield
Online Access:	Link to OAK Trust copy