Ha, C., & Kuo, W. (2005). Reliability-yield allocation for semiconductor integrated circuits: Modeling and optimization. [Texas A&M University].
Chicago Style (17th ed.) CitationHa, Chunghun, and Way Kuo. Reliability-yield Allocation for Semiconductor Integrated Circuits: Modeling and Optimization. [College Station, Tex.]: [Texas A&M University], 2005.
MLA (9th ed.) CitationHa, Chunghun, and Way Kuo. Reliability-yield Allocation for Semiconductor Integrated Circuits: Modeling and Optimization. [Texas A&M University], 2005.
Warning: These citations may not always be 100% accurate.