Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 : proceedings /

Bibliographic Details
Corporate Authors:	International Workshop on Structural and Syntactic Pattern Recognition Hong Kong, China, International Association for Pattern Recognition, International Workshop on Statistical Techniques in Pattern Recognition
Other Authors:	Yeung, Dit-Yan, 1960-
Format:	Conference Proceeding Book
Language:	English
Published:	Berlin ; New York : Springer, [2006]
Series:	Lecture notes in computer science. 4109.
Subjects:	Pattern recognition systems > Congresses.
Online Access:	Publisher description

Published 2006

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Conference Proceeding eBook