Cover Image

Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 : proceedings /

Show other versions (1)
Bibliographic Details
Corporate Authors: International Workshop on Structural and Syntactic Pattern Recognition Hong Kong, China, International Association for Pattern Recognition, International Workshop on Statistical Techniques in Pattern Recognition
Other Authors: Yeung, Dit-Yan, 1960-
Format: Conference Proceeding Book
Language:English
Published: Berlin ; New York : Springer, [2006]
Series:Lecture notes in computer science. 4109.
Subjects:
Pattern recognition systems > Congresses.
Online Access:Publisher description

Internet

Publisher description

Remote Storage

Holdings details from Remote Storage
Call Number: TK7882.P3 I57 2006
 
Call Number Status Get It
TK7882.P3 I57 2006 Available