International Workshop on Structural and Syntactic Pattern Recognition Hong Kong, China, International Association for Pattern Recognition, International Workshop on Statistical Techniques in Pattern Recognition, & Yeung, D. (2006). Structural, syntactic, and statistical pattern recognition: Joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 : proceedings. Springer.
Chicago Style (17th ed.) CitationInternational Workshop on Structural and Syntactic Pattern Recognition Hong Kong, China, International Association for Pattern Recognition, International Workshop on Statistical Techniques in Pattern Recognition, and Dit-Yan Yeung. Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 : Proceedings. Berlin ; New York: Springer, 2006.
MLA (9th ed.) CitationInternational Workshop on Structural and Syntactic Pattern Recognition Hong Kong, China, et al. Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 : Proceedings. Springer, 2006.