Interferometry XIII : techniques and analysis : 14-16 August 2006, San Diego, California, USA /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Creath, Katherine, Schmit, Joanna
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2006]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 6292.
Subjects:	Interferometry > Methodology > Congresses. Measurement > Congresses. Metrology > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/6292.toc

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