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Scanning probe microscopy : atomic scale engineering by forces and currents /

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Bibliographic Details
Main Author: Foster, A. (Adam Stuart), 1975-
Other Authors: Hofer, Werner, 1960-
Format: Book
Language:English
Published: New York : Springer Science+Business, [2006]
Series:Nanoscience and technology.
Subjects:
Scanning probe microscopy.
Description
Physical Description:xiv, 281 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0387400907