Scanning probe microscopy : atomic scale engineering by forces and currents /
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
New York :
Springer Science+Business,
[2006]
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| Series: | Nanoscience and technology.
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| Subjects: |
Evans: Library Stacks
| Call Number: |
QH212.S33 F68 2006 |
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| Call Number | Status | Get It |
| QH212.S33 F68 2006 | Available | |