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VLSI test principles and architectures : design for testability /

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Bibliographic Details
Other Authors: Wang, Laung-Terng, Wu, Cheng-Wen, EE Ph. D., Wen, Xiaoqing
Format: Book
Language:English
Published: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, [2006]
Series:Morgan Kaufmann series in systems on silicon.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Online Access:Table of contents
Publisher description
Description
Physical Description:xxx, 777 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0123705975 (hardcover : alk. paper)