VLSI test principles and architectures : design for testability /

Bibliographic Details
Other Authors:	Wang, Laung-Terng, Wu, Cheng-Wen, EE Ph. D., Wen, Xiaoqing
Format:	Book
Language:	English
Published:	Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, [2006]
Series:	Morgan Kaufmann series in systems on silicon.
Subjects:	Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design.
Online Access:	Table of contents Publisher description

Table of contents
Publisher description

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