A correlation analysis of the 1000-500 mb thickness tendency /

Bibliographic Details
Main Author:	Lambertson, Wayne
Corporate Authors:	United States. Navy, Naval Postgraduate School (U.S.)
Format:	Government Document Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1966.

Evans: US Documents (Annex 5th floor)