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Defects in high-k gate dielectric stacks : nano-electronic semiconductor devices /

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Bibliographic Details
Corporate Author: NATO Advanced Research Workshop on Defects in High-k Dielectric Nano-electronic Semiconductor Devices Saint Petersburg, Russia
Other Authors: Gusev, Evgeni
Format: Conference Proceeding Book
Language:English
Published: Dordrecht : Springer, [2006]
Series:NATO science series. Mathematics, physics, and chemistry ; v. 216.
Subjects:
Gate array circuits > Congresses.
Dielectrics > Congresses.
Semiconductors > Defects > Congresses.

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Call Number: TK7895.G36 N37 2005
 
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TK7895.G36 N37 2005 Available