Image quality and system performance III : 17-19 January 2006, San Jose, California, USA /

Bibliographic Details
Corporate Authors: IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors: Cui, Luke C., Miyake, Yoichi
Format: Book
Language:English
Published: Bellingham, Wash. : SPIE, [2006]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 6059.
Subjects:
Description
Item Description:At head of title: Proceedings of electronic imaging science and technology
Physical Description:1 volume (various pagings) : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819460990