Image quality and system performance III : 17-19 January 2006, San Jose, California, USA /

Bibliographic Details
Corporate Authors:	IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors:	Cui, Luke C., Miyake, Yoichi
Format:	Book
Language:	English
Published:	Bellingham, Wash. : SPIE, [2006]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 6059.
Subjects:	Imaging systems > Image quality > Congresses. Image transmission > Congresses. Image processing > Congresses.

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