Experimental fault characterization of a neural network /

Bibliographic Details
Main Author:	Tan, Chang-Huong
Corporate Author:	Langley Research Center
Format:	Government Document Microform Manuscript
Language:	English
Published:	[Urbana, Ill.] : [Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center] ; University of Illinois at Urbana-Champaign ; [1990]
Series:	NASA contractor report ; NASA CR-186885.
Subjects:	Classifications. Defects. Neural nets. Simulation. Systems analysis.
Online Access:	https://purl.fdlp.gov/GPO/LPS65381

Available Online