Cover Image

Two- and three-dimensional methods for inspection and metrology III : 24-26 October 2005, Boston, Massachusetts, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Harding, Kevin G.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2005]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 6000.
Subjects:
Computer vision > Congresses.
Imaging systems > Congresses.
Three-dimensional display systems > Congresses.
Quality control > Optical methods > Congresses.
Optical measurements > Congresses.
Metrology > Congresses.
Description
Item Description:Previous conference entitled: Two- and three-dimensional vision systems for inspection, control, and metrology.
Physical Description:1 volume (various pagings) : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819460249